Expandable digital error detection and correction device

Details Expandable digital error detection and correction device Expandable digital error detection and correction device

1993-04-26

1994-07-19

Baker, Stephen M.

Excavating

371 376, 371 401, H03M 1300

Patent

active

053316452

ABSTRACT:
A pair of similar, 32-bit, error detection and correction devices, including a "lower 32-bit" device (210) and an "upper 32-bit" device (212) are configured as a 64-bit, error detection and correction system. When a (64-bit) word of data is being stored in memory, the lower 32-bit device (210) develops, on an inter-device bus (226), signals representing generation partial check bits. The upper 32-bit device (212) receives the partial check bits (226), and develops signals representing final check bits (236) for storage with the corresponding data word in memory (220 and 234). When a (64-bit) word of data is being retrieved from memory, from signals representing check bits retrieved from memory (222), the lower 32-bit device (210) generates on an inter-device bus (224), signals representing correction partial syndromes. From the correction partial syndromes (224), the upper 32-bit device (212) develops, on another inter-device bus (228), signals representing correction partial check bits; generates full syndromes; and corrects errors in the upper 32-bits of the corresponding retrieved data word (240). From the correction partial check bits (228) the lower 32-bit device (210) (also) generates full syndromes; and corrects errors in the corresponding lower 32-bits of the retrieved data word (230).

REFERENCES:
Tate, G. et al., "EDC Chip Boosts Memory Reliability", Electronic Design, Sep. 1, 1980, pp. 151-155.
Twaddel, W., "Error-Checking and-Correcting ICs See Wider Use as Memory Size Grows", EDN, Mar. 4, 1981, pp. 31-40.
Bazes, M. et al., "Keep Memory Design Simple Yet Call Single-Bit Errors", Electronic Design, Sep. 30, 1981, pp. 195-201.

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