Exo-electron non-destructive test device and method

Details Exo-electron non-destructive test device and method Exo-electron non-destructive test device and method

1981-02-26

1982-10-26

Myracle, Jerry W.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

73577, G01N 332

Patent

active

043555381

ABSTRACT:
A non-destructive testing device and method is provided wherein a test piece is held in a test stand located in a test enclosure. The test enclosure is evacuated. The test stand and test piece held therein is then vibrated, immediately after which the test piece is irradiated by at least one beam of collimated radiant energy, preferably ultraviolet light, which is scanned over the test piece in a systematic pattern. Measurements of exo-electrons given off by the test piece responsive to the irradiation of the test piece are recorded for correlation with other exo-electron measurements made of the test piece throughout the life of the test piece. For metal test pieces not sensitive to this technique, a selected gas or gases (mixed or in sequence) may be introduced into the evacuated chamber for forming a surface compound of gas and metal on the surfaces of the test piece. The test enclosure is then evacuated and the test piece is vibrated and scanned by radiant energy and measurements taken.

REFERENCES:
patent: 4175447 (1979-11-01), Fukuhara
patent: 4283956 (1981-08-01), Lechner et al.

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