Exempt source for an x-ray fluorescence device

Details Exempt source for an x-ray fluorescence device Exempt source for an x-ray fluorescence device

2005-04-01

2008-10-28

Kiknadze, Irakli (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S203000, C378S102000

Reexamination Certificate

active

07443951

ABSTRACT:
An x-ray fluorescence (XRF) device and a method for using the same to analyze a sample are described. The EMRXG source of the XRF device has a configuration that allows a greater amount of EMRXG to impinge on the sample being analyzed. The x-ray detector of the XRF device has a configuration that allows a greater amount of x-rays emitted by the sample to impinge on the detector. With such a configuration, the size and cost of the x-ray fluorescence device decreases. As well, fewer EMRXG are needed from the EMRXG source because of the greater efficiency and an exempt EMRXG source that is exempt from radioactivity licensing requirements can be used.

REFERENCES:
patent: 2957079 (1960-10-01), Edholm
patent: 3992794 (1976-11-01), Lazarus
patent: 4054676 (1977-10-01), Weinshenker et al.
patent: 4136778 (1979-01-01), Wortman et al.
patent: 4251726 (1981-02-01), Alvarez
patent: 4363965 (1982-12-01), Soberman et al.
patent: 4390452 (1983-06-01), Stevens
patent: 4445225 (1984-04-01), White
patent: 4476382 (1984-10-01), White
patent: 4485308 (1984-11-01), Rabatin
patent: 4767205 (1988-08-01), Schwartz et al.
patent: 4862143 (1989-08-01), Hirshfield et al.
patent: 5057268 (1991-10-01), Muller
patent: 5185773 (1993-02-01), Blossfeld et al.
patent: 5202931 (1993-04-01), Bacus
patent: 5208630 (1993-05-01), Goodbrand et al.
patent: 5301044 (1994-04-01), Wright
patent: 5461654 (1995-10-01), Grodzins et al.
patent: 5474937 (1995-12-01), Anderson, II et al.
patent: 5527707 (1996-06-01), Fukazawa
patent: 5670239 (1997-09-01), Hampp
patent: 5677187 (1997-10-01), Anderson, II et al.
patent: 5692029 (1997-11-01), Husseiny et al.
patent: 5740223 (1998-04-01), Ozawa et al.
patent: 5760394 (1998-06-01), Welle
patent: 5830769 (1998-11-01), Wieder et al.
patent: 5849590 (1998-12-01), Anderson, II et al.
patent: 6005915 (1999-12-01), Hossain et al.
patent: 6007744 (1999-12-01), Nacker
patent: 6024200 (2000-02-01), Jang
patent: 6030657 (2000-02-01), Butland et al.
patent: 6041095 (2000-03-01), Yokhin
patent: 6075839 (2000-06-01), Treseder
patent: 6082775 (2000-07-01), Phillips
patent: 6097785 (2000-08-01), Elam
patent: 6106021 (2000-08-01), Phillips
patent: 6111929 (2000-08-01), Hazlett
patent: 6130931 (2000-10-01), Laurila et al.
patent: 6165609 (2000-12-01), Curatolo
patent: 6178226 (2001-01-01), Hell et al.
patent: 6178227 (2001-01-01), Sato
patent: 6200239 (2001-03-01), Kennedy, III et al.
patent: 6200628 (2001-03-01), Rozumek et al.
patent: D460370 (2002-07-01), Kaiser et al.
patent: 6477227 (2002-11-01), Kaiser et al.
patent: 6501825 (2002-12-01), Kaiser et al.
patent: 6631177 (2003-10-01), Haszler et al.
patent: 6668039 (2003-12-01), Shepard et al.
patent: 6670239 (2003-12-01), Yoon
patent: 6765986 (2004-07-01), Grodzins et al.
patent: 6850592 (2005-02-01), Schramm et al.
patent: 6859517 (2005-02-01), Wilson et al.
patent: 6909770 (2005-06-01), Schramm et al.
patent: 2002/0168045 (2002-11-01), Grodzins et al.
patent: 2003/0048877 (2003-03-01), Price et al.
patent: 0911626 (1999-04-01), None
patent: 0911627 (1999-04-01), None
patent: WO02/068945 (2002-09-01), None
U.S. Appl. No. 11/097,018, filed Apr. 1, 2005, Kenning et al.
Keegan, “Applying Data Matrix Identification Symbols on Aerospace Parts,” NASA Technical Standard NASA-STD-6002, Jul. 2, 2001.
Keegan, “Application of Data Matrix Identification Symbols on Aerospace Parts Using Direct Part Marking Methods/Techniques,” NASA-Technical Handbook NASA-HDBK-6003, Jul. 2, 2001.

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