Exclusive-option chips and methods with all-options-active...

Details Exclusive-option chips and methods with all-options-active... Exclusive-option chips and methods with all-options-active...

2011-04-19

2011-04-19

Patel, Paresh (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010, C324S762020

Reexamination Certificate

active

07928746

ABSTRACT:
A multi-interface integrated circuit in which, during the chip's lifetime in use, only one interface is active at a time. However, special test logic powers up all of the on-chip interface modules at once, so that a complete test cycle can be performed. All of the interfaces are exercised in one test program. Since some pads are inactive in some interface modes, mask bits are used to select which pads are monitored during which test cycles.

REFERENCES:
patent: 5627842 (1997-05-01), Brown et al.
patent: 6060897 (2000-05-01), Shacham et al.
patent: 6519171 (2003-02-01), Matsuzaki et al.
patent: 2005/0289251 (2005-12-01), Lee et al.
patent: 2010/0229038 (2010-09-01), Mayer et al.

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