Excitation in micromechanical devices

Measuring and testing – Speed – velocity – or acceleration – Angular rate using gyroscopic or coriolis effect

Reexamination Certificate

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C331S156000

Reexamination Certificate

active

07637158

ABSTRACT:
A resonant structure for a micromechanical device includes a crystalline silicon beam and at least one mass attached to the beam. An excitation plane of the resonant structure is defined by the predominant motion of the excited resonant structure. The beam includes crystal axes aligned such that none of the crystal axes are parallel to the length of the beam and/or none of the crystal axes are normal to the excitation plane.

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patent: 2003/0196490 (2003-10-01), Cardarelli
patent: 4228795 (1994-03-01), None

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