Measuring and testing – Speed – velocity – or acceleration – Angular rate using gyroscopic or coriolis effect
Reexamination Certificate
2006-10-06
2008-10-07
Kwok, Helen C. (Department: 2856)
Measuring and testing
Speed, velocity, or acceleration
Angular rate using gyroscopic or coriolis effect
C073S514150
Reexamination Certificate
active
07430908
ABSTRACT:
A resonant structure for a micromechanical device includes a beam and at least one mass attached to the beam. The resonant structure is arranged to have a predominantly rotational excitation mode and an excitation plane in which motion of the excited resonant structure predominantly takes place, the at least one mass including a geometry such that none of the principal axes of the rotational inertia tensor of the resonant structure are normal to the excitation plane.
REFERENCES:
patent: 4732647 (1988-03-01), Aine
patent: 5203208 (1993-04-01), Bernstein
patent: 6032531 (2000-03-01), Roszhart
patent: 6584845 (2003-07-01), Gutierrez et al.
patent: 2003/0196490 (2003-10-01), Cardarelli
patent: 4228795 (1994-03-01), None
Edell Shapiro & Finnan LLC
Infineon Technologies Sensonor AS
Kwok Helen C.
LandOfFree
Excitation in micromechanical devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Excitation in micromechanical devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Excitation in micromechanical devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3988213