Data processing: artificial intelligence – Neural network – Learning task
Reexamination Certificate
1998-11-28
2001-11-20
Powell, Mark R. (Department: 2122)
Data processing: artificial intelligence
Neural network
Learning task
Reexamination Certificate
active
06321215
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an examining method of tests with a computer, and more particularly to an artificial-intelligence (AI) examining method of tests with a computer to examine the learning performance of an examinee according to the examinee's answers of a series of arranged questions generated by the computer.
2. Description of Related Art
Computer aided tests of learning courses have been known for many years. Most of computer aided tests are used to understand the learning performance of an examinee in some learning courses, such as language learning courses. Examinations of these tests are used to give learning directions for examinees. The testing questions of a conventional computer aided test are randomly selected from a question library stored in a computer's memory. An examinee answers these question through the input unit of the computer, and the computer records and checks the examinee's answers. Then, according to the ratio of the correct answers, the computer gives a simple evaluation or suggestion to the examinee. For example, if the ratio of correct answers is sixty percent, the computer gives an evaluation like “More efforts will pursue the goal” to the examinee.
However, the learning status of an examinee cannot be exactly determined only according to the ratio of the examinee's correct answers of randomly given questions. This is because the random choice of testing questions cannot systematically analyze the examinee's learning status in learning courses. In addition, the correct-answer ratio of a test cannot clearly clarify and understand the examinee's weakness in the test. Hence, the examination of the test with the conventional computer aided examining method is not helpful to give an efficient learning guidance for an examinee.
SUMMARY OF THE INVENTION
The objective of the invention is to provide an examining method of a computer-aid test for understanding the learning performance of an examinee. The examining method of the invention gives more accurate and helpful examination and learning guidance to the examinee according to the examinee's answer record of a computer aided test.
According to the examinee's answers of the questions of a computer aided test, the computer-aid examining method of the present invention includes the following steps:
A. Build up a follow-up table of the computer aided test, which includes testing objective information, examinee's answer information and questions' sequence information;
B. List an examining report according to the follow-up table built in the step A, where the present step consists of the following steps:
b1. Build up an examining table which includes a plurality of learning performances and corresponding examining comments;
b2. According to the results of examinee's answers and the question's sequence shown in the step A, pick up a learning performance and a corresponding examining comment from the examining table as the contents of the examining report; and
b3. Display the examining report.
With the help of an AI question derivation method of a computer-aid test, the examining method of the present invention can enhance its capability. In fact, the examining method of the present invention is a three-dimension examining method which is a function of three variables, which is to say, the number of testing questions, the testing objective, and the examinee's learning performance. According to these variables, the computer-aid examining method of the present invention can give examinees a more efficient learning guidance.
REFERENCES:
patent: 6029043 (2000-02-01), Ho et al.
patent: 6126448 (2000-10-01), Ho et al.
patent: 6160987 (2000-12-01), Ho et al.
Chen Fred H. Y.
Chen Phoebe Q. J.
Tseng Bill P. J.
Yen Luke B. R.
Holmes Michael B.
Inventec Corp
Liauh W. Wayne
Powell Mark R.
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