Examining a gemstone

Details Examining a gemstone Examining a gemstone

1982-07-06

1985-07-16

Evans, F. L.

Optics: measuring and testing

Crystal or gem examination

356376, G01N 2187

Patent

active

045293058

ABSTRACT:
Method and apparatus for examining a gemstone to determine a parameter thereof. A thin beam of light is projected onto the stone, the beam is moved relative to the stone, the position where the beam strikes the stone is sensed in a direction different from that in which the beam is projected, and a parameter is determined making use of information derived from such sensing.

REFERENCES:
patent: 3244065 (1966-04-01), Lemelson
patent: 3625618 (1971-12-01), Bickel
Herron, R. E., "The Light Beam Profiler--Past, Present, and Future", SPIE, vol. 283, 3-D Machine Perception, (1981), pp. 61-65.
Battery Inspection Technology, Teknekron Controls Incorporated, Nov. 1979.

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