Examination system for architectural structure exteriors

Television – Special applications – Object or scene measurement

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

348 82, 348139, H04N 718

Patent

active

057423350

ABSTRACT:
Detailed images of problem areas occurring in the surface of a structure, such as a multiple story building, are obtained by infrared and visual spectrum cameras positioned proximate to the problem area. A remote camera records a reference field of view that includes the local cameras and their operator, such that the area of interest may be positioned on the surface of the building. A helmet camera worn by the operator records the detailed images and transmits them to a base location.

REFERENCES:
patent: 4495518 (1985-01-01), Sanoian
patent: 4647220 (1987-03-01), Adams et al.
patent: 4910593 (1990-03-01), Weil
patent: 4913558 (1990-04-01), Wettevik et al.
patent: 4999614 (1991-03-01), Ueda et al.
patent: 5005083 (1991-04-01), Grage et al.
patent: 5111048 (1992-05-01), Devitt et al.
patent: 5386117 (1995-01-01), Piety et al.
patent: 5416315 (1995-05-01), Filipovich
Proceedings (from) Seminar on Jun. 12, 1996 (report No. 16) City of Chicago Maintenance of Exterior Walls and Enclosures Ordinance. By The Chicago Committee on High Rise Buildings.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Examination system for architectural structure exteriors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Examination system for architectural structure exteriors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Examination system for architectural structure exteriors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2062912

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.