Examination of physical properties of thin films

Details Examination of physical properties of thin films Examination of physical properties of thin films

1991-01-28

1992-05-26

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With raman type light scattering

G01J 344, G01N 2165

Patent

active

051161214

ABSTRACT:
The physical properties of thin films can be examined with polarized light using a method which comprises directing polarized light at a layer system, exciting plasmon surface polaritons therein and thereby creating Raman-scattered light within the layer or layer system under examination, and imaging said light on a detector using an imaging system.

REFERENCES:
Surface Plasma Oscillations and Their Oscillations . . . Raether Physics of Thin Films, vol. 9, 145-361, New York 1977.
Surface Plasmon-Enhanced Raman Scattering at . . . Corn et al. J. Chem. Phys 80, May 15, 1984.
On the Laser-Wavelength Dependence of Plasmon Surface . . . Knobloch et al., J. Chem. Phys 91 Oct. 1, 1989.
Surface Plasmon Enhanced Raman Spectra of Monolayer . . . Knoll et al., J. Chem. Phys 77 Sep. 1, 1982.
Physical Methods of Chemistry, Kuhn et al., Spectroscopy of Monolayer Assemblies (Wiley, N.Y. 1972) part III B, chapter VII.
Multichannel Raman Spectroscopy with a Cooled CCD Iaging Detector Batchelder, ESN European Spectroscopy News, 80 (1988) 28-33.

Affiliated with

Also associated with

Rating

Examination of physical properties of thin films does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Examination of physical properties of thin films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Examination of physical properties of thin films will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-415068