Examination apparatus and focusing method of examination...

Details Examination apparatus and focusing method of examination... Examination apparatus and focusing method of examination...

2007-12-04

2007-12-04

Amari, Alessandro (Department: 2872)

Optical: systems and elements

Compound lens system

Microscope

C250S201300

Reexamination Certificate

active

11090036

ABSTRACT:
A focusing method for an examination apparatus that can quickly and easily perform focusing for fluoroscopy is provided. The focusing method, for an examination apparatus that can observe fluorescence emitted from a specimen, includes a first step of irradiating the specimen with light via an objective lens to generate reflected light and fluorescence; a second step of performing focusing with respect to the surface of the specimen using the reflected light from the specimen; and a third step of performing focusing for the fluorescence based on the focal position of the specimen surface in the second step.

REFERENCES:
patent: 5932872 (1999-08-01), Price
patent: 6072899 (2000-06-01), Irie et al.
patent: 7109459 (2006-09-01), Kam et al.
patent: 09-218355 (1997-08-01), None

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