Examination apparatus

Details Examination apparatus Examination apparatus

2007-01-03

2009-11-10

Stafira, Michael P (Department: 2886)

Optics: measuring and testing

Contour plotting

Reexamination Certificate

active

07616292

ABSTRACT:
The invention provides an examination apparatus including an objective optical system for positioning a focal point inside a specimen mounted on a stage; an image-acquisition apparatus for detecting light emitted in different optical-axis directions from the vicinity of the focal point inside the specimen and collected by the objective optical system to acquire a plurality of pieces of image information; and a three-dimensional image forming unit for forming a three-dimensional image of a light-emitting site in the vicinity of the focal point based on the plurality of pieces of image information acquired by the image-acquiring apparatus.

REFERENCES:
patent: 6160908 (2000-12-01), Hakozaki
patent: 6169289 (2001-01-01), White et al.
patent: 7180661 (2007-02-01), Sasaki
patent: 2004/0021771 (2004-02-01), Stearns et al.
patent: 2005/0187441 (2005-08-01), Kawasaki et al.
patent: 2006/0109546 (2006-05-01), Namba et al.
patent: 00/71028 (2000-11-01), None
patent: 2004/008123 (2004-01-01), None
Susumu Kikuchi et al., “Three-dimensional image reconstruction for biological micro-specimens using a double-axis fluorescence microscope,” Optics Communications, pp. 21-26 (1997).
Susumu Kikuchi et al., “Three-dimensional microscope computed tomography based on generalized Radon transform for optical imaging systems,” Optics Communications, pp. 725-733 (1996).

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