Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-11-26
2009-02-17
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S187000, C702S152000, C702S153000, C702S189000, C702S190000, C702S033000, C702S127000, C702S182000, C702S186000, C700S090000, C700S108000, C455S456100, C340S500000, C340S517000, C340S523000, C340S526000, C340S635000, C340S679000
Reexamination Certificate
active
07493224
ABSTRACT:
An improved method, apparatus, and computer instructions for generating trace data. In response to detecting a trace event, a determination is made as to whether identifiers for the trace event match recorded identifiers for a record in a set of previously recorded trace events. Location information for the record is placed in the trace data if a match between identifiers for the trace event and recorded identifiers for the record in the set of previously recorded trace events.
REFERENCES:
patent: 2883255 (1959-04-01), Anderson
patent: 3351910 (1967-11-01), Miller et al.
patent: 3906454 (1975-09-01), Martin
patent: 5608866 (1997-03-01), Horikawa
patent: 5715387 (1998-02-01), Barnstijn et al.
patent: 5799322 (1998-08-01), Mosher, Jr.
patent: 5918225 (1999-06-01), White et al.
patent: 5937413 (1999-08-01), Hyun et al.
patent: 6049798 (2000-04-01), Bishop et al.
patent: 6091712 (2000-07-01), Pope et al.
patent: 6363436 (2002-03-01), Hagy et al.
patent: 6507805 (2003-01-01), Gordon et al.
patent: 6525322 (2003-02-01), Wong et al.
patent: 6598012 (2003-07-01), Berry et al.
patent: 6658416 (2003-12-01), Hussain et al.
patent: 6678883 (2004-01-01), Berry et al.
patent: 6691207 (2004-02-01), Litt et al.
patent: 6741952 (2004-05-01), Eidson
patent: 6766511 (2004-07-01), Berry et al.
patent: 6936822 (2005-08-01), Wong et al.
patent: 6937961 (2005-08-01), Cabral et al.
patent: 7346476 (2008-03-01), Levine et al.
patent: 7369954 (2008-05-01), Levine et al.
patent: 2002/0121603 (2002-09-01), Wong et al.
patent: 2003/0154028 (2003-08-01), Swaine et al.
patent: 2004/0036025 (2004-02-01), Wong et al.
patent: 2004/0158776 (2004-08-01), McCullough et al.
patent: 2006/0010352 (2006-01-01), Mukherjee et al.
patent: 2006/0212243 (2006-09-01), Levine et al.
patent: 2006/0212244 (2006-09-01), Levine et al.
patent: 2006/0212761 (2006-09-01), Levine et al.
patent: 2006/0215997 (2006-09-01), Kamio et al.
IBM Research Discolure 421134, “Split-Memory Facility for Windows NT(tm)”, May 1999, pp. 729-730.
Burtscher et al., “Compressing Extended Program Traces Using Value Predictors”, Sep. 27-Oct. 1, 2003 pp. 159-169, Proceedings of the 12th International Conference on Parallel Architectures and Compilation Techniques, 2003. (PACT 2003).
Fox et al., “Compressing Address Trace Data for Cache Simulations”, IEEE 1997, pp. 439.
Johnson et al., “PDATS Lossless Address Trace Compression for Reducing File Size and Access Time”, 1994 IEEE International Phoenix Conference on Computers and Communications, pp. 213-219.
Milenkovic et al., “Exploiting Streams in Instruction and Data Address Trace Compression”, 2003 IEEE International Workshop on Workload Characterization, Oct. 27, 2003 pp. 99-107.
Levine Frank Eliot
Milenkovic Milena
Urquhart Robert J.
Glanzman Gerald H.
International Business Machines - Corporation
Kundu Sujoy K
Lau Tung S
Rodriguez Herman
LandOfFree
Event tracing with time stamp compression and history buffer... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Event tracing with time stamp compression and history buffer..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Event tracing with time stamp compression and history buffer... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4056912