Image analysis – Pattern recognition – Classification
Reexamination Certificate
2004-05-12
2008-07-29
Patel, Kanji (Department: 2624)
Image analysis
Pattern recognition
Classification
C382S305000, C701S200000, C348S113000
Reexamination Certificate
active
07406199
ABSTRACT:
Systems and methods are provided for filtering detected events to determine events of interest. A sensor data analysis system identifies a plurality of detected events from provided sensor data and evaluates the sensor data to determine at least one characteristic associated with each event. The sensor data analysis system reports the plurality of detected events and their associated characteristics. At least one affiliated event generator is operative to generate at least one affiliated event and produce at least one event report. A given event report provides at least one characteristic associated with an affiliated event. An event filtering system compares the at least one event report to the detected events to identify at least one affiliated event amongst the plurality of detected events.
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International Search Report for corresponding EP 05 25 3151, completed Nov. 14, 2005 by Examiner R. Niemeijer at The Hague.
Northrop Grumman Corporation
Patel Kanji
Tarolli, Sundheim Covell & Tummino LLP
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