Evanescent waveguide apparatus and method for measurement of...

Details Evanescent waveguide apparatus and method for measurement of... Evanescent waveguide apparatus and method for measurement of...

2007-10-30

2007-10-30

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S637000, C333S108000

Reexamination Certificate

active

11183307

ABSTRACT:
A dielectric constant waveguide measuring apparatus preferably comprises a rectangular waveguide aperture on each end with a width a and height b. The waveguide frame is preferably split to permit the waveguide to be opened for insertion of the unknown material into a middle reduced cross-sectional area portion of the waveguide frame. In one embodiment, a metal septum is inserted between two samples of the unknown material to thereby reduce the cross-sectional area of the waveguide aperture by splitting width a of the rectangular waveguide in half. The waveguide frame is closed and a frequency response of the waveguide is then measured. The dynamic dielectric constant of the unknown material is determined from the frequency of the lowest order minimum value of the frequency response of the waveguide apparatus wherein the unknown material has been inserted.

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