Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Patent
1988-04-01
1990-01-02
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Frequency of cyclic current or voltage
324 58C, G01R 2704
Patent
active
048915734
ABSTRACT:
A ceramic or other substrate is tested for dielectric constant K and loss tangent by placing it on a central transverse plane across a cylindrical waveguide. A swept-frequency signal is injected into the waveguide at an input coupling loop and is picked up at an output coupling loop. Maximum transmission through the dielectric substrate occurs at a frequency that depends on the waveguide radius, the substrate thickness, and the dielectric constant. The dielectric constant can be obtained from the resonant frequency of a predetermined transmission mode, e.g., the TE.sub.01 mode. The loss tangent can be calculated from the transmission bandwidth. The measurement of the dielectric constant is insensitive to the position of the substrate in the gap between waveguide sections, and thus intimate contact is not required.
REFERENCES:
Kooi et al., "Measurement of Dielectric Loss Using a Cut-Off Circular Waveguide Cavity;" IEEE Transactions on Instrumentation and Measurement; vol. IM-29, No. 1, Mar. 1980, pp. 44-48.
Howell, A Quick Accurate Method to Measure the Dielectric Constant of Microwave Integrated-Circuit Substrates, IEEE Transactions on Microwave Theory and Techniques, Mar. 1973, p. 142.
Pannell et al., Two Simple Methods for the Measurement of the Dielectric Permittivity of Low Loss Microstrip Substrates, IEEE Transactions on Microwave Theory and Technique, Apr. 1981, p. 383.
Ginzton, Microwave Measurements, McGraw-Hill, 1957, p. 438.
Guillon et al., Complex Permittivity Measurement of MIC Substrate, Arch. fuer Elektron. und Uebertragungstech., pp. 102-104, Mar. 1981.
S. B. Cohn, K. C. Kelly-"Microwave Measurement of High-Dielectric Constant Materials;" Sep., 1966; vol. MTT-14, No. 9; IEEE Transactions on Microwave Theory & Techniques.
A. R. Gerhard, Measuring Dielectric Constant of Substrates for Microstrip Applications, IEEE Transactions on Microwave Theory and Technique, Jul., 1976, p. 485.
Napoli et al., A Simple Technique for the Accurate Determination of the Microwave Dielectric Constant, etc., IEEE Transactions on Microwave Theory and Technique, Jul., 1971, p. 664.
Lenzig, Measurement of Dielectric Constant of Ceramic Substrates at Microwave Frequencies, Ceramic Bulletin, vol. 51, No. 4, p. 361.
Dielectric Labs, Inc.
Eisenzopf Reinhard J.
Miele Anthony L.
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