Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-03-01
2011-03-01
Le, Brian Q (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
07899236
ABSTRACT:
A system for evaluating optical distortion in an aircraft transparency, such as a windshield, is disclosed. The system utilizes high resolution digital images (a reference image and a test image) of a test grid structure having a pattern of visible index locations. In one embodiment, the test image is taken through the transparency under test, and the reference image is taken without the transparency. The two images are processed and analyzed by a computing device to determine displacement of each index location, relative to the reference image. The displacement data is further processed to obtain vector divergence field data that represents a quantitative measurement of the optical distortion. The optical distortion measurement data is then rendered in a suitable format that allows the transparency to be rated against certain quality criteria.
REFERENCES:
patent: 4776692 (1988-10-01), Kalawsky
patent: 5694479 (1997-12-01), Guering et al.
patent: 5724140 (1998-03-01), Haywood
patent: 6613483 (2003-09-01), Fujimoto
Standard Test Method for Measuring Optical Angular Deviation of Transparent Parts, 2002, pp. 1-8, ASTM International, West Conshohocken, PA.
Standard Practice for Optical Distortion and Deviation of Transparent Parts Using the Double-Exposure Method, 2003, pp. 1-4, ASTM International, West Conshohocken, PA.
Dixon Michael S.
Freeman Philip L.
Gleason Michael P.
Pless Robert B.
Smart William D.
Le Brian Q
Park Edward
The Boeing Company
Tung & Associates
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