Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-08-31
2009-10-27
Ahmed, Samir A. (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
Reexamination Certificate
active
07609891
ABSTRACT:
A method of evaluating element distribution within a data set, such as pixel characteristics whose scatterness is quantified. Scatterness is evaluated for individual scale levels as the image is merged through smaller scale levels. At each level, every pixel block (i.e., 2×2) in the region of interest merges to one pixel to form the next level. Select characteristics of the pixels are assessed in the merge, and the image may be simplified to fewer pixel states so the merges require less processor overhead. In one merge mode if any pixel in the block has the desired characteristic, then the resulting merged pixel is set with that characteristic. The merging rate of the pixels is used to determine the scatterness for the pixel distribution. A scatterness sequence can be used separately or in combination with known techniques for comparing images in applications such as search and classification.
REFERENCES:
patent: 5280547 (1994-01-01), Mahoney
patent: 5369714 (1994-11-01), Withgott et al.
patent: 5568569 (1996-10-01), Golin
patent: 5610658 (1997-03-01), Uchida et al.
patent: 6704454 (2004-03-01), Spence et al.
patent: 2004/0161153 (2004-08-01), Lindenbaum
G. Pass and R.Zabih, “Histogram Refinement for Content-Based Image Retrieval”, Proc. IEEE Workshop on Applications of Computer Vision, Sarasota, Florida, Dec. 1996, pp. 96-102.
Ahmed Samir A.
Fitzpatrick Atiba O
O'Banion John P.
Sony Corporation
Sony Electronics Inc.
LandOfFree
Evaluation of element distribution within a collection of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Evaluation of element distribution within a collection of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Evaluation of element distribution within a collection of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4102436