Evaluation method of insulating film and measurement circuit...

Details Evaluation method of insulating film and measurement circuit... Evaluation method of insulating film and measurement circuit...

2011-01-04

2011-01-04

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S555000

Reexamination Certificate

active

07863922

ABSTRACT:
Provided is a method of evaluating dielectric breakdown by applying a current to an insulating film, in which measurement for a forward direction current and measurement for a backward direction current are performed in a short period of time. For this purpose two MOS diodes in which an electrode of one MOS diode and a base of another MOS diode are short-circuited respectively are prepared to form a circuit to which the current is applied, providing current flow in one insulating film reverse to current flow in another insulating film, which enables the application of both the forward direction current and the backward direction current.

REFERENCES:
patent: 3599059 (1971-08-01), Hou
patent: 5880494 (1999-03-01), Watanabe
patent: 5986327 (1999-11-01), Mishio et al.
patent: 6410952 (2002-06-01), Momose et al.
patent: 6-201761 (1994-07-01), None

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