Evaluation method for interconnects interacted with...

Details Evaluation method for interconnects interacted with... Evaluation method for interconnects interacted with...

2011-08-16

2011-08-16

Garbowski, Leigh Marie (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Design of semiconductor mask or reticle

Analysis and verification

C716S136000

Reexamination Certificate

active

08001492

ABSTRACT:
A design and evaluation method for interconnect wires of integrated circuits is provided to detect, analyze and predict response of interconnect layout to integrated-circuit manufacture processes.

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