Evaluation circuit and evaluation method for the assessment...

Details Evaluation circuit and evaluation method for the assessment... Evaluation circuit and evaluation method for the assessment...

2006-10-04

2009-11-10

Tran, Michael T (Department: 2827)

Static information storage and retrieval

Floating gate

Particular biasing

C365S185240

Reexamination Certificate

active

07616492

ABSTRACT:
An electronic circuit arrangement includes a storage unit set up for storing at least two analog electrical quantities. A first evaluation circuit is coupled to the storage unit and is set up in such a way that it assesses the at least two analog electrical quantities and provides a first assessment result. A second evaluation circuit is coupled to the storage unit and is set up in such a way that it assesses at least one of the at least two analog electrical quantities with a predetermined threshold value and provides a second assessment result.

REFERENCES:
patent: 5642463 (1997-06-01), Nakano et al.
patent: 5864496 (1999-01-01), Mueller et al.
patent: 6369855 (2002-04-01), Chauvel et al.
patent: 6448887 (2002-09-01), Martin et al.
patent: 6469882 (2002-10-01), Tignor
patent: 6947315 (2005-09-01), Iwata
patent: 7177190 (2007-02-01), Lee
patent: 2002/0101778 (2002-08-01), Khan
patent: 2005/0195650 (2005-09-01), Deppe et al.
patent: 2006/0227018 (2006-10-01), Ejima et al.

Affiliated with

Also associated with

Rating

Evaluation circuit and evaluation method for the assessment... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Evaluation circuit and evaluation method for the assessment..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Evaluation circuit and evaluation method for the assessment... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4123096