Measuring and testing – With fluid pressure – Leakage
Reexamination Certificate
2005-11-01
2005-11-01
Garber, Charles (Department: 2856)
Measuring and testing
With fluid pressure
Leakage
Reexamination Certificate
active
06959586
ABSTRACT:
The present invention is a method for evaluating a multiplicity of data handling devices each having a sealed chamber with several interior surfaces. It uses an impurity chamber containing thousands of dispersed gas-borne particles that each contain a marker impurity that is substantially absent from all of the interior surfaces of at least one of the devices. That device is tested for vulnerability to external dust using the marker impurity.
REFERENCES:
patent: 4418369 (1983-11-01), Applequist et al.
patent: 4471395 (1984-09-01), Beck et al.
patent: 4535373 (1985-08-01), Schuh
patent: 4744919 (1988-05-01), O'Holleran
patent: 5097978 (1992-03-01), Eckerd
patent: 5109304 (1992-04-01), Pederson
patent: 5109380 (1992-04-01), Ogino
patent: 5138871 (1992-08-01), Retta et al.
patent: 5270887 (1993-12-01), Edwards et al.
patent: 5282101 (1994-01-01), Reinisch
patent: 5381701 (1995-01-01), Frankenthal et al.
patent: 5454157 (1995-10-01), Ananth et al.
patent: 5521776 (1996-05-01), Mochizuki
patent: 5671103 (1997-09-01), Tada
patent: 6276194 (2001-08-01), Vinton et al.
patent: 6446517 (2002-09-01), Sharma et al.
patent: 6675119 (2004-01-01), Liu
patent: 05052713 (1993-03-01), None
MIL-STD-810E Method 510.3 “Sand and Dust”, Jul. 14, 1989, p. 179 of 461.
ASTM Subcommittee, “Practice F1170-88(1993) Standard Practice For Determining The Performance of a Filter Medium Using Water and Siliceous Particles,” Book of Standards, ASTM (West Conshohocken, PA), vol. 14 (No. 4), (.
Powder Technology, Inc., “History of Test Dust,” Powder Technology, Inc. (Burnsville, MN).
Materials Bulletin, “PIT Environmental Test Method,” IBM.
David Weatherbee, “Particulate Test,” Product Assurance Engineering Report, Seagate Technology LLC only pp. 1, 2, 6, 9 & 10 received with figures 1, 2, 3, 4.
Altshuler Kenneth J.
Deibert John Douglas
Olson Jonathan E.
Watts Ronald Lee
Wilhelm Phillip S.
Fellers , Snider, et al.
Garber Charles
Seagate Technology LLC
LandOfFree
Evaluating data handling devices by means of a marker impurity does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Evaluating data handling devices by means of a marker impurity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Evaluating data handling devices by means of a marker impurity will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3508510