Evaluating anomaly for one-class classifiers in machine...

Details Evaluating anomaly for one-class classifiers in machine... Evaluating anomaly for one-class classifiers in machine...

2011-04-19

2011-04-19

Dunn, Drew A (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Quality evaluation

Reexamination Certificate

active

07930122

ABSTRACT:
A method for monitoring machine conditions provides additional information using a one-class classifier in which an evaluation function is learned. In the method, a distance is determined from an anomaly measurement x to a boundary of a region R1containing all acceptable measurements. The distance is used as a measure of the extent of the anomaly. The distance is found by searching along a line from the anomaly to a closest acceptable measurement within the region R1.

REFERENCES:
patent: 7308322 (2007-12-01), Discenzo et al.

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