Etching method for fabricating high quality optical fiber probe

Etching a substrate: processes – Nongaseous phase etching of substrate – Etching inorganic substrate

Reexamination Certificate

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C216S011000, C216S083000, C156S345110

Reexamination Certificate

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06905627

ABSTRACT:
Techniques for chemically etching a fiber tip to form a smooth fiber probe. One implementation applies a coating layer around a bare fiber to expose only an end facet of the bare fiber and then the exposed end facet is immersed into an etching liquid to be away from a meniscus interface between the etching liquid and the fiber to etch the fiber from the end facet.

REFERENCES:
patent: 4469554 (1984-09-01), Turner
patent: 5985166 (1999-11-01), Unger et al.
patent: 6203660 (2001-03-01), Unger et al.
patent: 6280647 (2001-08-01), Muramatsu et al.
patent: 2002/0081072 (2002-06-01), Ootsu et al.
Lambelet et al., “Chemically etched fiber tips for near-field optical microscopy: a process for smoother tips,” Applied Optics, vol. 37, No. 31, pp. 7289-7292, Nov. 1, 1998.
Zeisel et al., “Pulsed laser-induced desorption and optical imaging on a nanometer scale with scanning near-field microscopy using chemically etched fiber tips,” Appl. Phys. Lett., vol. 68, No. 18, pp. 2491-2492, Apr. 29, 1996.

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