Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2005-03-01
2005-03-01
Lee, Hsien-Ming (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S754000, C257S755000, C257S774000, C438S586000, C438S652000, C438S740000
Reexamination Certificate
active
06861751
ABSTRACT:
A self-aligned contact, and a method for fabricating the same, are provided. A conductive element having an overlying hydrogen silsesquioxane (HSQ)-based dielectric cap is formed over a semiconductor substrate. Dielectric sidewall spacers are then formed adjacent to sidewalls of the conductive element and the HSQ-based dielectric cap. A HSQ-based dielectric layer is formed over the resulting structure, and an inter-layer dielectric layer, such as TEOS, is formed over the HSQ-based dielectric layer. The inter-layer dielectric layer is then etched through a mask having an opening located over a sidewall spacer, a portion of the HSQ-based dielectric cap and a portion of the substrate. The etch (which may be a C5F8based etch) has a high selectivity (e.g., about 20:1) with respect to the HSQ-based dielectric layer, thereby enabling the etch to stop on the HSQ-based dielectric layer. Another etch removes the exposed HSQ-based dielectric layer to expose the substrate.
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Bever Hoffman & Harms LLP
Integrated Device Technology Inc.
Lee Hsien-Ming
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