Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-03-20
2000-02-22
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, G01R 3126
Patent
active
060284404
ABSTRACT:
The present invention provides an analytical solution for voltage drop and current density calculation based on design-specific current consumption. The new technique calculates voltage drop and current density at all desired points of the power supply mesh. One application of the method is power mesh sizing by scaling the mesh resistance by the ratio between allowed voltage drop budget and the maximum of the calculated voltage drop. The designer can easily obtain the maximum allowed resistance of a uniform mesh which meets exactly the voltage drop budget, taking into account the design-specific spatial distribution of current consumption. Since the computational cost of the new methodology is negligible, e.g. as compared to prior art methods of analysis, this invention is suitable for implementation embedded in an RTL floorplan tool for fast, interactive tradeoff between floorplan location and voltage drop.
REFERENCES:
patent: 4730160 (1988-03-01), Cusack et al.
patent: 5799172 (1998-08-01), Gullapalli et al.
Nguyen Lieu T.
Roethig Wolfgang
Ballato Josie
Kobert Russell M.
LSI Logic Corporation
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