Estimating yield fluctuation for back-end planning

Details Estimating yield fluctuation for back-end planning Estimating yield fluctuation for back-end planning

2011-07-26

2011-07-26

Jarrett, Ryan A (Department: 2121)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C700S110000

Reexamination Certificate

active

07987013

ABSTRACT:
A method for production planning includes receiving a first order quantity of a first device. A first yield estimate of the first device from a production line is determined. The first yield estimate is adjusted based on a first confidence factor associated with the first order quantity. A dispatch quantity for processing in the production line is determined based on the first order quantity and the adjusted first yield estimate.

REFERENCES:
patent: 7218980 (2007-05-01), Orshansky et al.
patent: 7242994 (2007-07-01), Ishibashi et al.
patent: 2004/0128177 (2004-07-01), Wei
patent: 2005/0278048 (2005-12-01), Chiu et al.

Affiliated with

Also associated with

Rating

Estimating yield fluctuation for back-end planning does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Estimating yield fluctuation for back-end planning, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Estimating yield fluctuation for back-end planning will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2657480