Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
Reexamination Certificate
2007-03-27
2009-02-03
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Timing
C375S224000
Reexamination Certificate
active
07487055
ABSTRACT:
A method and a device for estimating the jitter of a first periodic signal with respect to a second periodic signal, comprising steps of: sampling the first signal by means of the second one; providing the result of the sampling to the input of a shift register triggered by the second signal; comparing at least the first two states and the last state of a current word formed from parallel outputs of the shift register with respect to a reference word; and counting the number of occurrences of the reference word within a given measurement period.
REFERENCES:
patent: 5663970 (1997-09-01), Bae
patent: 5670901 (1997-09-01), Yoshida
patent: 5898707 (1999-04-01), Takabayashi
patent: 5930275 (1999-07-01), Horst
patent: 2002/0044325 (2002-04-01), Noguti
patent: 2007/0121714 (2007-05-01), Baker et al.
Boller Timothy L.
Bui Bryan
Jorgenson Lisa K.
Seed IP Law Group PLLC
STMicroelectronics SA
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