Estimating an electronic device condition

Details Estimating an electronic device condition Estimating an electronic device condition

2006-02-15

2008-03-25

Cosimano, Edward R (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C340S500000, C340S635000, C340S653000, C702S182000, C713S300000, C713S320000, C713S323000

Reexamination Certificate

active

07349828

ABSTRACT:
In a method for estimating a condition of an electronic device, a model correlating at least one utilization metric of a component of the electronic device and the condition of the component to be estimated is formulated. In addition, the at least one utilization metric of the component is detected and the condition of the component and the electronic device are estimated based upon the formulated model with the detected at least one utilization metric as an input to the formulated model.

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