Establishing correspondence and traceability between wafers...

Details Establishing correspondence and traceability between wafers... Establishing correspondence and traceability between wafers...

2011-04-05

2011-04-05

Chawan, Sheela C (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S141000, C136S249000

Reexamination Certificate

active

07920738

ABSTRACT:
The invention regards a method and a system for establishing correspondence between wafers and solar cells produced from said wafers. The method comprises for each wafer and each solar cell, providing an image of the wafer, providing an image of the cell, comparing the wafer image to the cell image, upon match between a cell image and a wafer image, assigning the current cell to the current wafer. The system comprises at least one imaging device for providing images of the wafers and the cells, a processing unit for comparing a wafer image to a cell image, and upon match between a cell image and a wafer image, assigning the current cell to the current wafer, and a memory unit.

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Office Action dated Aug. 31, 2010 from Japanese Patent Office.

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