ESD protection for SOI circuits

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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357 238, 357 2313, 357 42, 357 57, 357 59, 307283, H01L 2701, H01L 2713, H01L 2978

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active

049890573

ABSTRACT:
A floating body field effect transistor having a defined breakdown voltage, and a lower holding voltage, serves to clamp electrostatic discharge voltages to a low voltage level, thereby minimizing thermal power dissipation within the thin semiconductor layer of semiconductor-on-insulator circuits.

REFERENCES:
patent: 4489339 (1984-12-01), Uchida
patent: 4763183 (1988-08-01), Ng et al.
Schwob, P., SOS Technology, Bull. ASE/UCS 68 (1972) pp. 60-65.
"C-MOS/SOS Gate-Protection Networks", R. K. Pancholy and T. J. Oki, IEEE Transactions on Electron Devices, vol. ED-25, p. 927, 1978.
"An Improved Input Protection Circuit for C-MOS/SOS Arrays", S. H. Cohen and G. K. Caswell, ibid, p. 926.
"C-MOS/SOS LSI Input/Output Protection Networks", B. T. Ahlport, J. R. Cricchi and D. A. Barth, ibid, p. 933.
"Design and Characterization of Input Protection Networks for CMOS/SOS Application", W. Palumbo and M. P. Dugan, EOS/ESD Symposium Proceedings, p. 182, 1986.

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