Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure
Reexamination Certificate
2011-07-12
2011-07-12
Richards, N Drew (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Bipolar transistor structure
C257S330000, C257S355000, C257S361000, C257S513000, C257S532000
Reexamination Certificate
active
07977769
ABSTRACT:
An ESD protection device is described, which includes a first P-type doped region, a second P-type doped region, a first N-type doped region, a second N-type doped region and an isolation structure. The first P-type doped region is configured in a substrate. The second P-type doped region is configured in the first P-type doped region. The first N-type doped region is configured in the first P-type doped region and surrounds the second P-type doped region. The second N-type doped region is configured in the substrate and surrounds the first P-type doped region. The isolation structure is disposed between the first P-type doped region and the second N-type doped region, wherein a spacing is deployed between an outward edge of the first N-type doped region and the isolation structure.
REFERENCES:
patent: 5181091 (1993-01-01), Harrington et al.
patent: 2004/0026728 (2004-02-01), Yoshida et al.
patent: 2010/0148265 (2010-06-01), Lin et al.
J.C. Patents
Lee Kyoung
Richards N Drew
United Microelectronics Corp.
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