Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2006-09-19
2006-09-19
Jackson, Stephen W. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C257S170000, C257S360000, C257S355000, C257S357000, C257S361000, C349S040000, C349S054000
Reexamination Certificate
active
07110229
ABSTRACT:
An ESD protection circuit for low temperature poly-silicon thin film transistor panel and a display panel using the same. The feature of the ESD protection circuit comprises an ESD detection circuit disposed between a first power line and a second power line, for outputting an enable signal when an ESD event occurs in the first power line; and a discharge device having a control terminal coupled to the output of the ESD detection circuit, for providing a discharge path between the first and second power lines when the control terminal receives the enable signal.
REFERENCES:
patent: 5528188 (1996-06-01), Au et al.
patent: 5946177 (1999-08-01), Miller et al.
patent: 6538708 (2003-03-01), Zhang
patent: 6552879 (2003-04-01), Voldman
patent: 2002/0066929 (2002-06-01), Voldman
Ker Ming-Dou
Shih An
Tseng Tang-Kui
Yang Sheng-Chieh
Jackson Stephen W.
Quintero Law Office
Willoughby Terrence
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