Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2011-08-30
2011-08-30
Patel, Dharti (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C361S118000
Reexamination Certificate
active
08009399
ABSTRACT:
In some embodiments, an electrostatic discharge (ESD) protection circuit includes a substrate resistance control circuit coupled to a body of a first NMOS transistor. The substrate resistance control circuit increases a resistance of the body of the first NMOS transistor during an ESD event. The first NMOS transistor has a drain coupled to an input/output (I/O) pad and a gate coupled to a first voltage source. The first voltage source is set at ground potential.
REFERENCES:
patent: 6424510 (2002-07-01), Ajit et al.
patent: 6465768 (2002-10-01), Ker
patent: 6566715 (2003-05-01), Ker et al.
patent: 2010/0128401 (2010-05-01), Lai et al.
Duane Morris LLP
Patel Dharti
Taiwan Semiconductor Manufacturing Co. Ltd.
LandOfFree
ESD improvement with dynamic substrate resistance does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with ESD improvement with dynamic substrate resistance, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and ESD improvement with dynamic substrate resistance will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2716117