Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2006-05-09
2006-05-09
Barnie, Rexford (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S118000, C341S161000, C341S162000, C341S172000
Reexamination Certificate
active
07042373
ABSTRACT:
A pipeline ADC includes a pipeline structure having a plurality of analog-to-digital converting units cascaded in series; and a correcting unit coupled to the pipeline structure for correcting an output value of the pipeline structure according to a set of calibration constants. One of the analog-to-digital converting units contains a capacitor switching circuit. During error measurement of the pipeline ADC, the capacitor switching circuit switches to change capacitance allocation of the analog-to-digital converting unit so as to obtain the set of calibration constants.
REFERENCES:
patent: 5465092 (1995-11-01), Mayes et al.
patent: 5499027 (1996-03-01), Karanicolas et al.
patent: 5510789 (1996-04-01), Lee
patent: 5668549 (1997-09-01), Opris et al.
patent: 5929796 (1999-07-01), Opris et al.
patent: 6222471 (2001-04-01), Nagaraj
patent: 6369744 (2002-04-01), Chuang
patent: 6563445 (2003-05-01), Sabouri
patent: 6606042 (2003-08-01), Sonkusale et al.
patent: 6642871 (2003-11-01), Takeyabu et al.
Chiang Chia-Liang
Lee Chao-Cheng
Tsai Jui-Yuan
Wang Wen-Chi
Barnie Rexford
Hsu Winston
Nguyen Khai
Realtek Semiconductor Corp.
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