Error factor acquisition device, method, program, and...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration

Reexamination Certificate

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C324S650000, C324S076220

Reexamination Certificate

active

07348784

ABSTRACT:
A measurement system for circuit parameters of a device under test (DUT) that reduces the number of attachments and detachments of calibration kits. An error factor acquisition device includes a first calibrator connected to ports of a network analyzer that has a first state realization unit that determines open-circuit, short-circuit, and standard load states for the ports. Second calibrators connected to the first calibrator and the DUT have a second state realization unit that determines open-circuit, short-circuit, and standard load states for the ports. The first calibrator includes first connection units that connect the ports to the first state realization unit or to the respective second calibrators, while the second calibrators respectively include a second connection unit that connects the ports to the second state realization unit or the DUT.

REFERENCES:
patent: 6853198 (2005-02-01), Boudiaf et al.
patent: 6-88844 (1994-03-01), None
patent: 10-197577 (1998-07-01), None
patent: 11-38054 (1999-02-01), None
English language abstract of JP 11-38054, Feb. 12, 1999.
English language abstract of JP 10-197577, Jul. 31, 1998.
English language abstract of JP6-88844, Mar. 29, 1994.

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