Error detection and correction system

Excavating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

371 13, 371 37, G06F 1100

Patent

active

046463127

ABSTRACT:
An error detection and correction apparatus including a transmission bus for transmitting multi-bit data signals and multi-bit error correction code signals generated responsive to the multi-bit data signals in accordance with a modified Hamming code technique. Parity generators are connected to the bus for receiving the bits of the data signals and selected bits of the error correction code signals in accordance with the modified Hamming code technique for determining if a single bit error exists in the data. A two-state comparison gate is connected to the parity generators which has a first state if a single bit error does exist, and a second state if a single bit error does not exist. A separate error detection and correction circuit is provided to detect and correct any single bit errors in the data on the transmission bus. The two-state comparison gate is reset to its second state after the separate error detection and correction circuit corrects any single bit error in the data.

REFERENCES:
patent: 3648239 (1972-03-01), Carter
patent: 3668632 (1972-06-01), Oldham
patent: 3688265 (1972-08-01), Carter et al.
patent: 4037091 (1977-07-01), Beuscher
patent: 4249253 (1981-02-01), Gentili
patent: 4345328 (1982-08-01), White
patent: 4355391 (1982-10-01), Alsop
patent: 4388684 (1983-06-01), Nibby, Jr. et al.
patent: 4394763 (1983-07-01), Nagano
patent: 4413339 (1983-11-01), Riggle
patent: 4456996 (1984-06-01), Haas
patent: 4502141 (1985-02-01), Kuki
Electronic Engineering, vol. 54, No. 663, Mar. 1982.
M. Y. Hsiao et al., "Double-Error Correcting Code with Separable Single-Error Correcting Capability," IBM Technical Disclosure Bulletin, vol. 14, No. 8, Jan. 1972, pp. 2363-2365.
R. Korody et al. "Purge Your Memory Array of Pesky Error Bits," Electrical Design News, vol. 25, No. 10, May 20, 1980, pp. 154-155.
J. P. Brosius, Jr. et al., "Fault-Tolerant Plated Wire Memory for Long Duration Space Missions," Digest of Papers of the International Symposium on Fault Tolerant Computing, Palo Alto, Symposium 3, IEEE, New York, Jun. 21-22, 1973, pp. 33-38.
D. E. Waldecker, "Memory Error Correction," IBM Technical Disclosure Bulletin, vol. 13, No. 1, Jun. 1970, pp. 52-53.
C. Carinalli et al., "High Performance Dynamic RAM Support Circuits," IEEE Electro, vol. 7, No. 5, May 1982, pp. 1-11.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Error detection and correction system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Error detection and correction system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Error detection and correction system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-114293

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.