Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2007-01-04
2008-08-19
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185170, C365S185220
Reexamination Certificate
active
07414891
ABSTRACT:
An erase-verify method for a NAND flash memory includes a serial double-step erase verify. A verify operation is performed on cells in the unit connected to even word lines by biasing all the even word lines at the read voltage value used in read mode, and by biasing all the odd word lines at the pass voltage value used in read mode of the selected unit. A verify operation is performed on the cells connected to odd word lines by biasing all the odd word lines at the read voltage value used in read mode and by biasing the all even word lines at the pass voltage value used in read mode of the selected unit. Verifying the odd and even word lines may be performed in either order.
REFERENCES:
patent: 5297096 (1994-03-01), Terada et al.
patent: 5638327 (1997-06-01), Dallabora et al.
patent: 5754469 (1998-05-01), Hung et al.
patent: 5754476 (1998-05-01), Caser et al.
patent: 5768188 (1998-06-01), Park et al.
patent: 5777924 (1998-07-01), Lee et al.
patent: 5781474 (1998-07-01), Sali et al.
patent: 5793679 (1998-08-01), Caser et al.
patent: 5822247 (1998-10-01), Tassan Caser et al.
patent: 5835414 (1998-11-01), Hung et al.
patent: 5844404 (1998-12-01), Caser et al.
patent: 5848013 (1998-12-01), Caser et al.
patent: 5854764 (1998-12-01), Villa et al.
patent: 5862074 (1999-01-01), Park
patent: 5978270 (1999-11-01), Tanaka et al.
patent: 5982663 (1999-11-01), Park
patent: 5994948 (1999-11-01), Bartoli et al.
patent: 5999451 (1999-12-01), Lin et al.
patent: 6021069 (2000-02-01), Hung et al.
patent: 6040734 (2000-03-01), Villa et al.
patent: 6055188 (2000-04-01), Takeuchi et al.
patent: 6081452 (2000-06-01), Ohta
patent: 6130841 (2000-10-01), Tanaka et al.
patent: 6137725 (2000-10-01), Caser et al.
patent: 6157054 (2000-12-01), Caser et al.
patent: 6195290 (2001-02-01), Dallabora et al.
patent: 6320361 (2001-11-01), Dima et al.
patent: 6320792 (2001-11-01), Caser et al.
patent: 6339551 (2002-01-01), Bartoli et al.
patent: 6349059 (2002-02-01), Bartoli et al.
patent: 6353350 (2002-03-01), Bedarida et al.
patent: 6373746 (2002-04-01), Takeuchi et al.
patent: 6385107 (2002-05-01), Bedarida et al.
patent: 6401164 (2002-06-01), Bartoli et al.
patent: 6421276 (2002-07-01), Goltman
patent: 6442068 (2002-08-01), Bartoli et al.
patent: 6442070 (2002-08-01), Tanaka et al.
patent: 6480436 (2002-11-01), Confalonieri et al.
patent: 6512702 (2003-01-01), Yamamura et al.
patent: 6624683 (2003-09-01), Bedarida et al.
patent: 6724241 (2004-04-01), Bedarida et al.
patent: 6785183 (2004-08-01), Sivero et al.
patent: 6804148 (2004-10-01), Bedarida et al.
patent: 6831499 (2004-12-01), Oddone et al.
patent: 6854040 (2005-02-01), Bartoli et al.
patent: 6912598 (2005-06-01), Bedarida et al.
patent: 6963512 (2005-11-01), Geraci et al.
patent: 7130209 (2006-10-01), Reggiori et al.
patent: 7158415 (2007-01-01), Bedarida et al.
patent: 7177198 (2007-02-01), Bedarida et al.
patent: 7181565 (2007-02-01), Surico et al.
patent: 7184311 (2007-02-01), Frulio et al.
patent: 2001/0019260 (2001-09-01), Dima et al.
patent: 2002/0018390 (2002-02-01), Confalonieri et al.
patent: 2002/0114207 (2002-08-01), Takeuchi et al.
patent: 2002/0122347 (2002-09-01), Frulio et al.
patent: 2003/0051093 (2003-03-01), Takeuchi
patent: 2003/0105941 (2003-06-01), Lomazzi et al.
patent: 2003/0126204 (2003-07-01), Surico
patent: 2003/0147293 (2003-08-01), Geraci et al.
patent: 2004/0046681 (2004-03-01), Frulio et al.
patent: 2004/0052145 (2004-03-01), Sivero et al.
patent: 2004/0057259 (2004-03-01), Oddone et al.
patent: 2004/0076037 (2004-04-01), Bedarida et al.
patent: 2004/0080360 (2004-04-01), Bedarida et al.
patent: 2006/0044885 (2006-03-01), Frulio et al.
patent: 2006/0062063 (2006-03-01), Bedarida et al.
patent: 2006/0077714 (2006-04-01), Surico et al.
patent: 2006/0077746 (2006-04-01), Sivero et al.
patent: 2006/0083060 (2006-04-01), Reggiori et al.
patent: 2006/0083097 (2006-04-01), Frulio et al.
patent: 2006/0085622 (2006-04-01), Bartoli et al.
patent: 2006/0114721 (2006-06-01), Frulio et al.
patent: 2006/0140010 (2006-06-01), Bedarida et al.
patent: 2006/0140030 (2006-06-01), Bedarida et al.
patent: 2006/0146610 (2006-07-01), Takeuchi et al.
patent: 2006/0161727 (2006-07-01), Surico et al.
patent: 2006/0250851 (2006-11-01), Surico et al.
patent: 2006/0253644 (2006-11-01), Surico et al.
patent: 2006/0279988 (2006-12-01), Bedarida et al.
patent: 2007/0025134 (2007-02-01), Reggiori et al.
patent: 2007/0047325 (2007-03-01), Bedarida et al.
Bartoli Simone
Caser Fabio Tassan
Passerini Marco
Sivero Stefano
Atmel Corporation
Nguyen Tan T.
Schwegman Lundberg & Woessner, P.A.
LandOfFree
Erase verify method for NAND-type flash memories does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Erase verify method for NAND-type flash memories, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Erase verify method for NAND-type flash memories will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4016601