Thermal measuring and testing – Temperature measurement – Composite temperature-related paramenter
Patent
1997-04-08
1999-07-27
Chilcot, Richard
Thermal measuring and testing
Temperature measurement
Composite temperature-related paramenter
374 57, 374166, G01K 300, G01K 700, G01N 360
Patent
active
059278544
DESCRIPTION:
BRIEF SUMMARY
BACKGROUND OF THE INVENTION
The present invention relates to electrical or electronic apparatus.
It is well-known that the expected life-time of electronic apparatus is very dependent on the temperature to which the apparatus has been subjected. For example, the expected life-time of semi-conductor based products may be halved for each prolonged rise in temperature of approximately 10 to 20.degree. C. It is possible to formulate theoretical expectancy equations which relate the expected remaining life-time against time already operated at a certain temperature, from which estimates for the expected failure for the product can be established. However such equations are only valid on a large population, so for a user of only a few pieces of equipment it is not feasible to use this approach.
The present invention provides electrical or electronic apparatus characterised by means to determine in which of a plurality of predetermined temperature bands of differing size temperature ranges the apparatus ambient temperature is and means to record outputs of the determination means.
In this way, there is produced a record of the degree of stress to which the apparatus has been subjected and so allows the user to have an indication of how the life-time of the product has been shortened. By having temperature bands of differing sizes, careful and accurate monitoring of temperature regions of particular interest can readily be achieved. In one example, size of a band decreases with increased temperature.
BRIEF SUMMARY OF THE INVENTION
The invention may have any one or more of the following features: temperature ranges of different sizes such that the size of the temperature range in a band decreases for increased values of temperature; the temperature band; previous measurement(s) increases; on the temperature of a section of the apparatus and/or the environs of such a section; of measurement locations on the electronic apparatus and/or between a plurality of measurement locations on different pieces of equipment; determination means and/or the recording means.
The present invention also provides a method of monitoring electronic apparatus comprising determining in which of a plurality of predetermined temperature bands of differing size temperature ranges the apparatus ambient temperature is and recording outputs of the determination means.
The information resultant from the invention can be used in a variety of different ways. For example, the information can be displayed to the user of the apparatus by an appropriate display means e.g. a hand-held terminal, a PC screen (whether LCD or cathode, ray tube) or a printer. Alternatively or additionally, the information can be stored for use later e.g. when the apparatus is being maintained, serviced and/or repaired; such information would also be of assistance to the manufacturer in quality analysis and/or predicting failure-rates or life-times of subsequent apparatus.
The invention is applicable to a wide variety of types of apparatus, including in particular controllers, recorders, programmers, also flow, pressure or temperature transmitters.
The invention is particularly beneficial because the results achieved by the apparatus and method of the invention can be applied to certain well known and well-defined relationships of aging and stress against temperature, thereby resulting in accurate life-expectancy predictions which can readily and simply obtained. Such characteristics for electronic and electrical equipment follow well-defined processes and equations, so that monitoring according to the present invention can give very valuable information on expected failure, whereas mechanical equipment do not follow such well-defined processes because other less-precise operations are involved including e.g. motion of parts, mechanical stress, metal fatigue.
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
In order that the invention may more readily be understood, a description is now given, by way of example only, reference being made to the accompanying draw
REFERENCES:
patent: 3035443 (1962-05-01), Gray
patent: 4286465 (1981-09-01), Thomae
patent: 4733974 (1988-03-01), Hagerman
patent: 5255149 (1993-10-01), Matsuo
Chilcot Richard
Clark Robin
Honeywell S.A.
Miologos Anthony
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