Measuring and testing – Testing of apparatus
Patent
1995-06-01
1996-07-09
Chilcot, Richard
Measuring and testing
Testing of apparatus
G01N 1900
Patent
active
055334130
ABSTRACT:
An equipment diagnosis system for diagnosing the functional state, the deterioration state, the remaining life time state, etc, of various equipment, and comprising an equipment state model portion for modelling the state of a diagnosis target equipment and for outputting information of the functional state, deterioration, remaining life time, etc, of the diagnosis target equipment on the basis of input information; stress information supply means for supplying the equipment stage model portion with appropriate information on stress which is applied to the diagnosis target equipment; comparison means for comparing information outputted from the equipment state model portion with information which is obtained on the basis of an actual maintenance result; and model correction means for correcting a parameter of the equipment state model portion on the basis of the comparison result.
REFERENCES:
patent: 4858224 (1989-08-01), Nakano et al.
patent: 5377112 (1994-12-01), Brown et al.
patent: 5421204 (1995-06-01), Svaty, Jr.
Fukuda Tatsuo
Imai Hideki
Kobayashi Yasunori
Miyazawa Masazumi
Tanabe Shin
Chilcot Richard
Kojima Moonray
Mitsubishi Chemical Corporation
Noori Max
Yokogawa Electric Corporation
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