Thermal measuring and testing – Thermal calibration system
Patent
1985-07-12
1987-02-17
Yasich, Daniel M.
Thermal measuring and testing
Thermal calibration system
374179, G01K 1500
Patent
active
046435867
ABSTRACT:
An equipment for the calibration of a temperature sensing device comprises an HF-induction coil capable of generating an alternating magnetic field which produces heat in the device to be calibrated. The actual temperature of the device is measured by a thermocouple attached directly to the surface of said device.
REFERENCES:
patent: 2422734 (1947-06-01), Jung
patent: 2962680 (1960-11-01), Sidaris
patent: 2993363 (1961-07-01), Howell
patent: 3377838 (1968-04-01), Kanazawa et al.
patent: 3699800 (1972-10-01), Waldron
patent: 3738174 (1973-06-01), Waldron
patent: 3939687 (1976-02-01), Waldron
patent: 4396818 (1983-08-01), Kominami et al.
patent: 4541731 (1985-09-01), Comey et al.
LandOfFree
Equipment and method for calibration of instruments having a tem does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Equipment and method for calibration of instruments having a tem, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Equipment and method for calibration of instruments having a tem will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1934903