Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1979-05-14
1981-02-24
Moore, David K.
Electricity: measuring and testing
Plural, automatically sequential tests
324158R, G01R 1512
Patent
active
042530598
ABSTRACT:
On-chip circuitry for measuring the threshold voltage and hence the data retention reliability of the floating gate transistors used in erasable programmable read-only computer memories. Upon the application of a program "verification" signal, an externally adjustable and calibrated voltage ramp is applied by the test circuit to each of the memory X-lines coupled to the gate elements of the memory transistors. The threshold voltage of a selected transistor can then be determined by increasing the voltage ramp to the point at which the transistor will read out.
REFERENCES:
patent: 3122724 (1964-02-01), Felton et al.
patent: 3478286 (1969-11-01), Dervan
patent: 3795859 (1974-03-01), Benante et al.
Bell Antony G.
Parekh Rajesh H.
Fairchild Camera & Instrument Corp.
Moore David K.
Park Theodore Scott
Pollock Michael J.
Winters Paul J.
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