Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Encapsulating
Reexamination Certificate
2007-01-02
2007-01-02
Feely, Michael J. (Department: 1712)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Encapsulating
C428S413000, C428S414000, C438S118000, C438S119000, C523S400000, C523S440000, C525S523000, C525S529000
Reexamination Certificate
active
10758487
ABSTRACT:
The present invention provides an epoxy resin composition for packaging a semiconductor device, characterized in having improved mold releasability during a molding process, continuous-moldability and improved solder resistance. According to the present invention, there is provided an epoxy resin composition for packaging the semiconductor element, obtained by formulating: (A) an epoxy resin; (B) a phenolic resin; (C) a curing accelerator; (D) an inorganic filler; and (E) an oxidized polyethylene wax having a drop point within a range of from 60 to 140 degree C., an acid value within a range of from 10 to 100 (mg KOH/g), a number average molecular weight within a range of from 500 to 20,000, and a mean particle size within a range of from 5 to 100 μm, wherein at least one of (A) epoxy resin and (B) phenolic resin is a novolac structured resin having biphenylene structure, and wherein content of (E) oxidized polyethylene wax in epoxy resin composition is within a range of from 0.01 to 1 % wt.
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Machine translation of JP 10-007888, provided by the JPO website.
Feely Michael J.
Smith , Gambrell & Russell, LLP
Sumitomo Bakelite Co. Ltd.
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