Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2006-06-13
2006-06-13
Young, Christopher G. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
C430S030000, C430S296000, C430S328000, C430S394000, C430S942000
Reexamination Certificate
active
07060397
ABSTRACT:
A method of correcting a defective portion of an exposure window in a lithography mask, such as an EPL mask, includes a first step of irradiating a defective portion of the exposure window using a charge particle beam to perform correction processing, and a second step of irradiating another portion of the exposure window with the charged particle beam to eliminate attached matter therefrom, the attached matter consisting of particles ejected from the defective portion of the exposure window as a result of irradiation with the charged particle beam during the first step. The first step and the second step are sequentially repeated N times, wherein N is an integer of 2 or more, to thereby reduce the time needed for eliminating the attached matter.
REFERENCES:
patent: 4548883 (1985-10-01), Wagner
patent: 5882823 (1999-03-01), Neary
Iwasaki Kouji
Oi Masamichi
Yamamoto Yo
Adams & Wilks
SII NanoTechnology Inc.
Young Christopher G.
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