Epitaxial wafer of gallium arsenide phosphide

Metal treatment – Barrier layer stock material – p-n type

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148 334, 148DIG97, 437127, 437976, H01L 3300

Patent

active

054567653

ABSTRACT:
A mixed crystal ratio difference is introduced in a gallium arsenide phosphide mixed crystal layer having a desired constant mixed crystal ratio, thereby reducing the amount of stress remaining within the resulting epitaxial wafer. This is less likely or unlikely to crack, and so can be well used for LED fabrication.

REFERENCES:
patent: 4252576 (1981-02-01), Hasegawa et al.
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patent: 4789421 (1988-12-01), Umeno et al.
patent: 4865655 (1989-09-01), Fujita et al.
patent: 4968642 (1990-11-01), Fujita et al.
patent: 5057442 (1991-10-01), Haluka

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