Semiconductor device manufacturing: process – Gettering of substrate – By layers which are coated – contacted – or diffused
Reexamination Certificate
2008-12-12
2011-10-04
Smith, Matthew (Department: 2823)
Semiconductor device manufacturing: process
Gettering of substrate
By layers which are coated, contacted, or diffused
C438S473000, C438S761000, C257SE21054, C257SE21318, C257SE21461
Reexamination Certificate
active
08030184
ABSTRACT:
An epitaxial wafer comprises a silicon substrate, a gettering epitaxial film formed thereon and containing silicon and carbon, and a main silicon epitaxial film formed on the gettering epitaxial film, in which the gettering epitaxial film has a given carbon atom concentration and carbon atoms are existent between its silicon lattices.
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German Office Actions corresponding to Application No. 10 2008 062 040.8-43, dated Mar. 14, 2011, English language translation.
Adachi Naoshi
Motoyama Tamio
Jefferson Quovaunda V
Smith Matthew
Sughrue & Mion, PLLC
Sumco Corporation
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