Epitaxial wafer and method of producing the same

Semiconductor device manufacturing: process – Gettering of substrate – By layers which are coated – contacted – or diffused

Reexamination Certificate

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C438S473000, C438S761000, C257SE21054, C257SE21318, C257SE21461

Reexamination Certificate

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08030184

ABSTRACT:
An epitaxial wafer comprises a silicon substrate, a gettering epitaxial film formed thereon and containing silicon and carbon, and a main silicon epitaxial film formed on the gettering epitaxial film, in which the gettering epitaxial film has a given carbon atom concentration and carbon atoms are existent between its silicon lattices.

REFERENCES:
patent: 3512056 (1970-05-01), Chu Ting Li et al.
patent: 3648123 (1972-03-01), Ernick et al.
patent: 2006/0175613 (2006-08-01), Lee et al.
patent: 2007/0020893 (2007-01-01), Ueno et al.
patent: 102006005875 (2006-08-01), None
patent: 2000-216168 (2000-04-01), None
German Office Actions corresponding to Application No. 10 2008 062 040.8-43, dated Mar. 14, 2011, English language translation.

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