Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state
Reexamination Certificate
2009-07-20
2011-12-20
Kunemund, Bob M (Department: 1714)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
C117S090000, C117S092000, C117S093000, C438S455000, C438S507000
Reexamination Certificate
active
08080106
ABSTRACT:
Provided are an epitaxial silicon wafer in which the warping is reduced by rendering a cross-sectional form of a silicon wafer for epitaxial growth into an adequate form as compared with the conventional one, and a production method thereof.An epitaxial silicon wafer comprising a silicon wafer for epitaxial growth and an epitaxial layer is characterized in that the epitaxial layer is formed on a silicon wafer for epitaxial growth having a cross-sectional form satisfying a relation of a given expression.
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patent: 2005/0215858 (2005-09-01), Vail, III
patent: 06-112120 (1994-04-01), None
patent: 2008-140856 (2008-06-01), None
Hashimoto Yasuyuki
Kihara Takayuki
Takaishi Kazushige
Christensen O'Connor Johnson & Kindness PLLC
Kunemund Bob M
Sumco Corporation
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