Communications: electrical – Selective – Interrogation response
Reexamination Certificate
2008-03-05
2010-11-30
Hunnings, Travis R (Department: 2612)
Communications: electrical
Selective
Interrogation response
C340S572100, C340S010100
Reexamination Certificate
active
07843317
ABSTRACT:
An electronic device has at least one component that is coated with a material that is non-persistent if exposed to a specific environmental condition. If the coating is stripped off by the specific environmental condition, the previously coated component's function is altered, causing a functionality of the electronic device to be altered.
REFERENCES:
patent: 4778552 (1988-10-01), Benge et al.
patent: 2005/0212675 (2005-09-01), Green
patent: 2009/0146810 (2009-06-01), Monk et al.
patent: 2009/0153334 (2009-06-01), Burns et al.
patent: 2009/0224916 (2009-09-01), Angell et al.
Cain, J.T. et al, “Energy Harvesting for DNA Gene Sifting and Sorting ” International Journal of Parallel and Distributed Systems and Networks, vol. 4, No. 3, 2001, Pittsburgh, PA, USA.
Anonymous Disclosure, “Using Radio Frequency Identification to Ensure the Correct Chemicals Are Used for Wafer Processing” IP.Com Prior Art Database Technical Disclosure, Feb. 16, 2007.
Collins, J. “Hitachi Unveils Integrated RFID Tag” RFID Journal, WWW.RFIDJOURNAL.COM/ARTICLE/ARTICLEVIEW/556/1/1/.
Block, R. “Hitachi Shows Off 7.5 Micron Thick MU-Chip RFID Tag” ENGADGET.COM Article, Feb. 6, 2006, WWW.ENGADGET.COM/2006/02/06/HITACHI-SHOWS-OFF-7-5-MICRON-THICK-MU-CHIP-RFID-TAG/.
Angell Robert L.
Kraemer James R.
Dillon & Yudell LLP
Hunnings Travis R
International Business Machines - Corporation
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