Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1988-04-05
1990-08-14
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158P, 277 34, G01R 102, G01R 104
Patent
active
049490311
ABSTRACT:
Apparatus for environmental stress screening of electronic components includes a chamber having a wall defining an opening therein. A product carrier pallet has a portion dimensioned and configured to inserted in the opening. The portion of the product carrier pallet has a periphery and structure is provided to seal the periphery with respect to the opening. Structure is provided for conducting a plurality of electrical signals through the portion and for electrical coupling to the structure for conducting. The structure for electrical coupling is disposed outside of the product carrier pallet. The apparatus may include a zero insertion force connector. Other forms of the invention relate to a chamber having opposed aligned openings.
REFERENCES:
patent: 3133180 (1964-05-01), Suverkropp
patent: 3339011 (1967-08-01), Ewers, Jr. et al.
patent: 3807383 (1974-04-01), Lawler
patent: 3923197 (1975-12-01), Kuhn
patent: 3958552 (1976-05-01), Lawler
patent: 3977387 (1976-08-01), Lawler
patent: 4045735 (1977-08-01), Worcester et al.
patent: 4131934 (1978-12-01), Becker et al.
patent: 4249846 (1981-07-01), Worsham
patent: 4337499 (1982-06-01), Cronin et al.
patent: 4352274 (1982-10-01), Anderson et al.
patent: 4374317 (1983-02-01), Bradshaw
patent: 4460332 (1984-07-01), Lawler et al.
patent: 4468616 (1984-08-01), Yoshizaki
patent: 4483178 (1984-11-01), Miille
patent: 4542341 (1985-09-01), Santomango et al.
patent: 4566594 (1986-01-01), Sleger et al.
patent: 4573011 (1986-02-01), Rochat et al.
patent: 4643627 (1987-02-01), Bednorz et al.
patent: 4643629 (1987-02-01), Takahashi et al.
patent: 4683424 (1987-07-01), Cutright et al.
patent: 4695707 (1987-09-01), Young
patent: 4699555 (1987-10-01), Guarino
patent: 4812750 (1989-03-01), Keel et al.
"The Fourth Dimension in Memory Board Testing-Environmental Stress Screening", by Nicholson et al., 6/85, pp. 1-9, Proc. of ATE West Conf., 1985.
"Commercial Electronics ESS-Application and Fixturing Considerations", by Colby, 1/86, Proc. of ATE West Conf., 1986.
"Aerotronic Aquarius Stress Screening System for ECA Manuf." by IBM, 7/86.
Shaw Russell G.
Szasz Norbert I.
Abate Joseph P.
Burns W.
Eisenzopf Reinhard J.
General Signal Corporation
Smith Robert S.
LandOfFree
Environmental stress screening apparatus for electronic products does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Environmental stress screening apparatus for electronic products, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Environmental stress screening apparatus for electronic products will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-465018