Enhancing the image contrast of a high resolution exposure tool

Photocopying – Projection printing and copying cameras – Step and repeat

Reexamination Certificate

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C355S067000, C355S055000

Reexamination Certificate

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08054449

ABSTRACT:
A system and method are utilized to equalize intensity or energy in various diffraction order portions of a patterned beam. The patterned beam is formed using a diffractive patterning device. An attenuator is placed at a pupil of a projection system to attenuate respective diffraction order portions of the patterned beam. The projection device is also used to project the patterned beam onto a target portion of a substrate, after the respective attenuations.

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Notice of Reasons for Rejection mailed Aug. 3, 2010 for Japanese Patent Application No. 2007-296176, 4 pgs.

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